	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
195	81	592169	14	81	454413	12	76	477562	13	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-195

Thr_Max in register units for M3R4-195

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	80	79	80	77	81	88	81	85	69	82	79	82	76	87	84	87
FEB-2	80	86	81	93	68	83	81	89	77	87	66	90	75	85	76	83
FEB-3	74	77	80	80	70	81	78	72	72	71	76	84	68	80	77	76

Noise rate at Thr_Max [counts/sec] for M3R4-195

Noise rate at Thr_Max [counts/sec] for M3R4-195

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	632499	800973	588608	510458	425771	474825	420460	758399	439597	441082	558081	754085	643162	668293	627912	730491
FEB-2	235812	620259	235504	727764	148605	587658	355921	559186	237416	545610	242324	592653	292707	723936	342632	822627
FEB-3	394850	532225	442681	456107	387792	350294	429042	428116	406611	393694	482494	398960	542393	723892	666656	605186