	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
198	74	561773	14	82	500695	12	78	594702	14	24-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-198

Thr_Max in register units for M3R4-198

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	73	67	80	72	79	75	71	72	75	77	72	72	76	74	70	85
FEB-2	80	86	84	86	78	84	79	91	81	80	76	83	76	83	81	79
FEB-3	87	72	86	72	82	74	78	81	84	78	73	76	73	79	71	75

Noise rate at Thr_Max [counts/sec] for M3R4-198

Noise rate at Thr_Max [counts/sec] for M3R4-198

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	503028	730866	477866	441172	398609	615125	674446	327730	706466	418340	645762	396371	639116	426877	808255	778343
FEB-2	621003	485199	557941	414220	313507	430309	378213	456736	464830	609051	450293	429015	446233	761482	724523	468564
FEB-3	521116	714260	442823	751888	558390	515771	553420	445292	701797	435377	501813	587735	589956	681448	882353	631790