	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
199	76	416016	12	79	544565	12	84	488665	13	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-199

Thr_Max in register units for M3R4-199

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	73	80	76	69	70	71	76	77	71	77	75	83	76	77	79	79
FEB-2	76	79	75	74	88	74	78	86	73	75	77	85	80	83	84	78
FEB-3	89	82	82	88	83	77	87	78	86	84	83	81	84	76	95	85

Noise rate at Thr_Max [counts/sec] for M3R4-199

Noise rate at Thr_Max [counts/sec] for M3R4-199

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	457818	362646	376883	380855	338204	448584	440583	421550	475388	315635	342505	554236	337722	390029	678588	335030
FEB-2	612535	786767	615508	588654	816187	410905	388671	692167	376565	462396	434769	556956	453896	456973	595102	464984
FEB-3	491977	626208	438563	383664	467247	356234	368662	303810	294078	651177	517808	395610	676704	652650	634399	559845