	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
200	79	407777	12	75	524586	13	75	358007	11	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-200

Thr_Max in register units for M3R4-200

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	71	81	79	82	76	82	78	77	80	84	80	79	78	83	78	78
FEB-2	79	69	76	79	74	66	80	68	85	71	83	73	80	72	74	66
FEB-3	78	82	71	77	75	79	71	78	70	82	74	76	75	76	68	67

Noise rate at Thr_Max [counts/sec] for M3R4-200

Noise rate at Thr_Max [counts/sec] for M3R4-200

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	520595	453308	406588	444817	352609	493611	319589	280379	343344	501106	297776	333447	361817	400663	495916	518869
FEB-2	706478	531462	414814	426878	464982	455007	799967	775381	442199	349112	490332	409636	460571	662177	567457	436921
FEB-3	550709	463474	308832	328762	275075	301270	239465	324433	258073	362169	256744	282853	419472	317208	613046	426532