	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
5	80	436804	13	73	450116	13	77	446673	13	23-JAN-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-5

Thr_Max in register units for M3R4-5

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	74	85	77	83	78	88	76	80	72	82	75	75	82	83	85	78
FEB-2	73	68	78	73	70	71	71	71	71	75	76	80	79	71	71	75
FEB-3	80	71	76	84	79	76	74	74	75	79	69	77	74	83	80	77

Noise rate at Thr_Max [counts/sec] for M3R4-5

Noise rate at Thr_Max [counts/sec] for M3R4-5

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	500954	564264	454862	422572	362132	501242	380871	429142	368112	516157	323218	503759	342291	432264	433490	453527
FEB-2	444033	700058	426062	597273	243391	453674	585997	605594	349176	351723	339078	371330	414890	383833	483062	452681
FEB-3	418328	486005	488863	263243	469934	357856	416029	265796	470250	244907	513246	396804	840904	365631	662289	486675