	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
50	76	494971	14	83	547228	13	82	538756	13	08-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-50

Thr_Max in register units for M3R4-50

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	71	73	74	75	82	72	83	66	80	69	81	78	82	81	83	73
FEB-2	88	80	90	82	77	80	84	84	85	86	82	85	82	80	82	75
FEB-3	80	84	78	82	77	87	86	87	81	90	78	85	83	79	72	80

Noise rate at Thr_Max [counts/sec] for M3R4-50

Noise rate at Thr_Max [counts/sec] for M3R4-50

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	595461	586125	522105	511396	560133	461471	419555	341291	698706	415390	457524	357602	455353	520636	573172	443611
FEB-2	596418	605703	448079	469052	744755	455090	398505	563194	468396	688902	462575	392017	668780	558032	709728	526423
FEB-3	425416	508356	662202	809598	390026	662114	320023	557536	448926	745319	508890	453649	487232	443912	612231	584658