	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
54	81	522871	14	78	588873	13	78	423435	13	08-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-54

Thr_Max in register units for M3R4-54

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	80	89	72	92	74	79	81	87	72	85	85	76	85	79	80	82
FEB-2	84	78	79	80	82	79	71	83	68	80	75	79	74	81	73	75
FEB-3	72	85	78	75	78	81	81	79	72	81	74	76	78	81	77	74

Noise rate at Thr_Max [counts/sec] for M3R4-54

Noise rate at Thr_Max [counts/sec] for M3R4-54

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	389808	630277	389309	769476	332128	622009	529842	514178	268866	494617	346797	761077	446278	755665	486864	628744
FEB-2	876255	604750	573450	827415	574480	527483	419211	390842	478610	368371	698203	542918	537111	614892	743228	644756
FEB-3	442536	425057	555146	272029	711240	287020	408936	294229	452521	322630	481915	358559	539665	292836	610971	319665