	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
55	73	455823	14	82	467949	12	76	484472	13	08-FEB-07		Sens=7.5mV/fc Th=15fc

Thr_Max in register units for M3R4-55

Thr_Max in register units for M3R4-55

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	63	72	75	68	73	72	69	67	72	76	85	68	68	83	78	74
FEB-2	78	81	79	81	79	84	80	89	79	89	77	88	76	78	82	84
FEB-3	76	80	82	77	78	74	76	80	73	76	78	72	72	74	80	69

Noise rate at Thr_Max [counts/sec] for M3R4-55

Noise rate at Thr_Max [counts/sec] for M3R4-55

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	558220	540695	517804	364583	417393	365148	620003	326687	403015	215870	738682	248721	477167	407566	642567	449048
FEB-2	414346	630231	297265	787031	319710	412313	333631	429787	396910	534350	344413	455583	464119	526723	534852	605924
FEB-3	484303	488440	541134	353112	436063	523360	490397	325660	499031	235546	468609	480491	442083	412841	702081	868400