	<i>Thresholds Scan<br />185 M3R4 chambers passed the tests</i></font> Thresholds Scan 185 M3R4 chambers passed the tests

Tables below present:
- Thr_Max(r.u.), Thresholds in register units at Maximum of noise rate;
- N_Max, Noise rate at Thr_Max in counts/sec;
- D_100 = Thr_100(r.u.) - Thr_Max(r.u.) where Thr_100(r.u.) is the threshold in register units at noise rate = 100/s.
The following expression relates the real threshold (measured from the base-line of physical signals) with the thresholds determined by the register units:
Thr(fC)*S(r.u./fC) = Thr(r.u.) - Thr_Max(r.u.)+ OFFSet(r.u.).
Here, OFFSet=17 register units;
S=3.40 r.u./fC is the charge sensitivity corresponding to S=8mV/fC taken for M3R4 chambers;
(Note, that 1 register unit = 2.35 mV)

	FEB-1. Mean values.			FEB-2. Mean values.			FEB-3. Mean values.
Chamber	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Thr_Max [r.u.]	N_Max [counts/s]	D_100 [r.u.]	Test Date	Plots	Comments
66	83	537060	13	75	519876	13	77	488415	13	15-JUN-07

Thr_Max in register units for M3R4-66

Thr_Max in register units for M3R4-66

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	90	82	94	87	79	82	83	86	83	84	81	79	77	74	75	89
FEB-2	76	80	65	81	74	82	72	73	75	79	71	76	72	76	81	71
FEB-3	75	74	78	83	78	75	76	73	83	77	75	81	74	77	75	80

Noise rate at Thr_Max [counts/sec] for M3R4-66

Noise rate at Thr_Max [counts/sec] for M3R4-66

FEB Channels	Ch_1	Ch_2	Ch_3	Ch_4	Ch_5	Ch_6	Ch_7	Ch_8	Ch_9	Ch_10	Ch_11	Ch_12	Ch_13	Ch_14	Ch_15	Ch_16
FEB-1	482747	702847	536604	552313	370943	541548	331348	439128	382682	444648	574315	541454	478453	776448	508912	928562
FEB-2	437206	526564	402190	850230	388740	429413	514489	512180	433666	590957	388490	533766	523067	588505	508046	690507
FEB-3	491597	466259	553622	512525	434170	429027	413822	347557	539888	384766	491946	422444	510602	558550	606362	651497